High content imaging system and a method of operating the high content imaging system

ABSTRACT

A high content imaging system and a method of operating the high content imaging system are disclosed. A microscope has a first objective lens and a second objective lens, and an objective lens database has first and second transformation values associated with the first and the second objective lenses, respectively. A microscope controller operates the microscope with the first objective lens to develop first values of acquisition parameters. A configuration module automatically determines second values of the acquisition parameters using the first values of the acquisition parameters, first transformation values associated with the first objective lens, and second transformation values associated with the second objective lens. The microscope controller operates the microscope using the second objective lens and the second values of the acquisition parameters.

RELATED APPLICATIONS

This application is the national stage under 35 U.S.C. 371 ofInternational Application No. PCT/US2016/015297, filed on Jan. 28, 2016,which claims priority to U.S. provisional application No. 62/109,708filed on Jan. 30, 2015, entitled “A High Content Imaging System and aMethod of Operating the High Content Imaging System”, the contents ofboth of which are incorporated by reference herein in their entireties.

FIELD OF DISCLOSURE

The present subject matter relates to configuration of a high contentimaging system, and more particularly, to configuration of acquisitionsettings for a high content imaging system.

BACKGROUND

A high content imaging system (HCIS) may be used for semi-automaticallyor automatically capture images of a microscopy sample. A typical HCISincludes a microscope having objective lenses of differentmagnifications, one or more illumination sources and an image capturedevice such as a charge-coupled device or a complementarymetal-oxide-semiconductor (CMOS) chip to produce images of themicroscopy samples. The illumination source may include a laser or otherlight source that scans the microscopy sample with focused light, andlight reflected from microscopy sample and/or transmitted through themicroscopy sample is imaged by the image capture device. In some cases,the illumination source may cause the microscopy sample to fluoresce andlight emitted by such fluorescence may be captured by the image capturedevice.

In addition, the microscopy samples may reside at various measurementlocations (e.g., wells) of a sample holder. Once the HCIS is configuredwith acquisition parameter values for a selected objective lens andillumination source, the HCIS may automatically image a plurality ofmicroscopy samples using the selected objective lens and illuminationsource. Such acquisition parameter values may include an exposure timeper wavelength of light to produce an image of a particular intensity, adistance between the focal plane of the objective and the illuminationsource focus position, and laser autofocus exposure time.

Typically, each time a different objective lens is selected for use withthe microscopy sample, the acquisition parameter values used for imagingmay need to be adjusted based on the new objective lens. Such adjustmentof acquisition parameter values may have to be specified by the userusing one or more sample images captured by the HCIS, and thus reducethe efficiency of the HCIS.

SUMMARY

According to one aspect, a high content imaging system includes amicroscope having a first objective lens and a second objective lens, anobjective lens database, a microscope controller, and a configurationmodule. The objective lens database has first and second transformationvalues associated with the first and the second objective lenses,respectively. The microscope controller operates the microscope with thefirst objective lens to develop first values of acquisition parameters.The configuration module automatically determines second values of theacquisition parameters using the first values of the acquisitionparameters, first transformation values associated with the firstobjective lens, and second transformation values associated with thesecond objective lens. Thereafter, the microscope controller operatesthe microscope using the second objective lens and the second values ofthe acquisition parameters.

According to another aspect, a method of operating a high contentimaging system that includes a microscope, a first objective lens, asecond objective lens, and an image capture device, includes the step ofoperating the microscope with the first objective lens to develop firstvalues of acquisition parameters. The method also includes the step ofautomatically determining second values of the acquisition parametersusing the first values of the acquisition parameters, firsttransformation values associated with the first objective lens, andsecond transformation values associated with the second objective lens.In addition, the method includes the step of operating the microscopeusing the second objective lens and the second values of the acquisitionparameters.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram of a high content imaging system;

FIG. 2 is a flowchart of processing undertaken to automaticallyconfigure the high content imaging system of FIG. 1; and

FIG. 3 is a flowchart of processing undertaken to develop an objectivelens database used by the high content imaging system of FIG. 1.

DETAILED DESCRIPTION

Referring to FIG. 1, an HCIS 100 includes a microscope 102, a microscopecontroller 104, a graphical user interface (GUI) controller 106, aconfiguration module 108, and an objective lens database 110. Themicroscope 102 may include one or more objective lenses, one or moreillumination sources, a focusing laser, focusing mechanics, one or morefilters, and an image capture device. Such components are typicallyinstalled in the microscope 102 before the microscope 102 is deliveredto a user. In some cases, such components may be modified after deliveryof the microscope 102, for example, as part of an upgrade or for aspecial application. U.S. patent application Ser. No. 14/238,121,published as U.S. Patent Appl. Pub. No. 2014/0210981A1, describes anexample HCIS. The entire contents of this application are incorporatedherein by reference.

The microscope controller 104 may provide digital commands or electronicsignals to configure the microscope 102 for a particular application.Such configuration may include selection of an objective lens, anillumination source, and/or specification of values of one or moreacquisition parameters described above.

In some embodiments, the GUI controller 106 may be coupled with a screenof, for example, a computer 112 operated by the user. The GUI controller106 may display on the screen computer 112 the values of acquisitionparameters with which the microscope 102 is currently configured. Inaddition, the GUI controller 106 may allow the user to use an inputdevice associated with the computer 112 to modify values of suchacquisition parameters.

During operation of the HCIS 100, the user loads a microscopy sampleinto the HCIS 100, and uses the input device of the computer 112 tospecify an objective lens, an illumination source, and the like to usefor imaging with the microscope 100. The GUI controller 106 providessuch acquisition parameters to the microscope controller 104, whichconfigures the microscope 102 accordingly. Thereafter, the microscopecontroller 104 directs the microscope to load the selected objectivelens into the light path between the microscopy sample and the imagecapture device and directs the image capture device of the microscope100 to capture an evaluation image of at least a portion of themicroscopy sample. The microscope controller 104 receives from the imagecapture device the evaluation image, and provides such image to the GUIcontroller 106 for display on the screen associated with the computer112.

The evaluation image may be imaged at a lower resolution than the HCIS100 can produce and/or may be an image of only a portion of themicroscopy sample. The user may evaluate the evaluation image, and ifthe intensity, focus, and other aspects of the evaluation image are asexpected by the user, uses the input device of the computer 112 todirect the HCIS 100 to image the entire microscopy sample. The GUIcontroller 106, the microscope controller 104, and the microscope 102operate as described above to generate a final image of the microscopysample that is at full resolution and/or includes the entire sample.Such final image may be displayed on the screen of the computer 112,recorded on a storage medium (not shown) associated with the HCIS 100,recorded on a storage medium (not shown) associated with the computer112, and/or transmitted to another system (not shown) for furtherprocessing.

However, if the user is not satisfied with the quality of the evaluationimage, the user may modify the values of one or more acquisitionparameters using the input device of the computer 112, and direct theHCIS 100 to capture a further evaluation image. The user may iterate inthis manner until an evaluation image is captured that satisfies theexpectations of the user, after which the user may direct the HCIS 100to capture a final image of the microscopy sample as described above.

As one who has ordinary skill in the art would appreciate, adjustmentsof values of acquisition parameters such as focal distance, exposuretime, and the like may be easier to make using a low magnificationobjective lens. Therefore, the user may direct the HCIS 100 to use a lowmagnification objective lens to capture and assess the evaluationimages, and then direct the HCIS 100 to capture the final image using anobjective lens that has higher magnification. Similarly, the user maydirect the HCIS 100 to configure values of the acquisition parameters ofthe HCIS 100 using the low magnification objective as described above,then direct the HCIS 100 to capture one or more final images using thelow magnification objective lens and capture additional images using oneor more other objective lenses.

In those cases in which the user uses a first objective lens to captureone or more evaluation images of a microscopy sample and/or to configureparameters of the microscope 100, and then directs the HCIS 100 to use asecond objective lens to capture a further image the microscopy sample,the configuration module 108 may automatically derive from the values ofthe acquisition parameters used with the first objective lens, thevalues of the acquisition parameters to use with the second objectivelens. Such automatic derivation of values of the acquisition parametersmay save the user time and effort of evaluating images captured by theHCIS 100 using the second objective lens, and/or manually determiningthe parameters to use with the second objective lens.

The configuration module 108 uses information stored in the objectivelens database 110 to automatically determine the values of theacquisition parameters to use with second objective lens from the valuesof the acquisition parameters used with the first objective lens. Inparticular, the objective lens database 110 includes the specificationsfor the objective lenses installed in the microscope 102. In oneembodiment, for each acquisition parameter, the objective lens database110 includes a transformation value that specifies a relationshipbetween a value of such parameter with respect to a first objective lensand values of such acquisition parameter with other objective lenses.For example, the objective lens database 110 may specify for theacquisition parameter Exposure Time at 550 nm Wavelength, atransformation value of 100% for a 10× Plan Fluor objective lens, atransformation value of 140% for a 20× S Fluor objective lens, and atransformation value of 180% for a 40× Plan Apo objective lens.

In the example above, if the first objective lens is the 10× Plan Fluorlens, the second objective lens is the 40× Plan Apo lens, and the userdetermined using the 10× Plan Fluor that an exposure of 1 second is anappropriate exposure, the configuration module 108 uses thetransformation values associated with such lenses and stored in theobjective lens database 110 to determine that the microscope should beconfigured to use an exposure of 1.8 seconds (i.e., 1 second times180%/100%) with the 40× Plan Apo lens.

The table below shows examples of acquisition parameters for which atransformation value may be stored in the objective lens database 110,and a unit of such transformation value. The table also shows how theconfiguration module 108 may transform a first value of a particularacquisition parameter that is used with a first objective O1 into asecond value of the acquisition parameter for use with a secondobjective lens O2. Such transformation is determined using the first andsecond transformation values TV(O1) and TV(O2) associated with the firstand second objective lenses, respectively, and associated with theacquisition parameter. It should be apparent to one of ordinary skill inthe art that transformation values may be stored in the objective lensdatabase 110 in an entry associated with each objective lens in themicroscope 100.

Unit of Trans- Acquisition formation Parameter Value (TV) TransformExposure time (ET) Percent ET(O2) = ET(O1) * TV(O2)/ TV(O1) Focal PlaneOffset Microns F(O2) = F(O1) + TV(O2) − P(O1) (F) Laser AutofocusPercent LT(O2) = LT(O1) * TV(O2)/ Exposure Time TV(O1) (LT) Pixel Sizein X- Microns PSX(O2) = PSX(O1) + TV(O2) − direction (PSX) TV(O1) PixelSize in Y- Microns PSX(O2) = PSY(O1) + TV(O2) − direction(PSY) TV(O1)

The transformation values for some acquisition parameters, for example,the exposure time and the focal plane offset may be specified for each aplurality of wavelengths of light. In some embodiments, the HCIS 100 mayassociate a range of wavelengths of light emitted or reflected by thesample into channels, wherein each channel corresponds to a portion ofthe light spectrum. In such embodiments, the objective lens database 108may include transformation values for each such channel. In someembodiments, the objective lens database 108 may include transformationvalues associated with wavelengths (or channels) of light that areemitted and imaged in fluorescent microscopy, and additionaltransformation values associated with wavelengths of light that arereflected and imaged in brightfield microscopy. Other transformationvalues, such as the laser autofocus exposure time may not vary by thewavelength of light, and therefore the objective lens database 108 mayinclude one transformation value that is used regardless of thewavelength of light.

In some embodiments, after the configuration module 108 has determinedthe second values of acquisition parameters to use with the secondobjective lens from the first values of the acquisition parameters usedwith the first objective lens, the GUI controller 106 of the HCIS 100may display the second values of acquisition parameters for the user toreview. The user may then request that the HCIS 100 capture anevaluation image of the microscopy sample using the second objective andthe second values of acquisition parameters. The GUI controller 106 maydisplay such evaluation image on the screen of the computer 112, andallow the user to adjust the second values of the acquisition parametersone or more times before final image(s) of the microscopy sample arecaptured.

Referring to FIG. 2, a flowchart 200 illustrates operation of the HCIS100 as described above. At block 202, the GUI controller 106 receivesfrom the user a selection of an initial objective lens.

At block 204, the HCIS 100 develops the microscope acquisitionparameters for the initial objective lens. In particular, the microscopecontroller 104 may direct the microscope 100 to capture an evaluationimage. The GUI controller 106 may display the evaluation image on thescreen associated with the computer 112, and receive from the useradjustments to the values of the acquisition parameters used to generatethe evaluation image. In some cases, the user may direct, using theinput device associated with the computer 112, the HCIS 100 to capture,and store and/or display a final image of the microscopy sample usingthe initial objective lens as described above.

At block 206, the GUI controller 106 receives from the user a selectionof a further objective lens and provides such selection to themicroscope controller 104. The microscope controller 104 directs theconfiguration module 108 to develop the values of the acquisitionparameters to be used with the further objective lens.

At block 208, the configuration module 108 retrieves from the objectivelens database 110 first and second transformation values associated withthe initial and the further objective lenses, respectively, for eachacquisition parameter. At block 210, the configuration module 108 usesthe value of the acquisition parameters used with the initial microscopelens, and the first and second transformation values associated withsuch parameters to determine the values of acquisition parameters to usewith the further objective lens. Such values of the acquisitionparameters to use with the further objective lens are provided to themicroscope controller 104, which configures the microscope 100accordingly.

At block 212, the microscope controller 104 configures the microscope102 to use the further objective lens selected at block 206 and thevalues of the acquisition parameters determined at block 210, anddirects the microscope 104 to capture one or more images of themicroscopy sample. The microscope controller, also at block 212,receives such captured image(s), and stores the captured images and/ordisplays the captured images on the screen associated with the computer112.

In some embodiments, the GUI controller 106 may display the values ofthe acquisition parameters for use with the further objective determinedat block 210, and/or an evaluation image captured using such values, andallow the user to modify these values before the microscope controller104 operates the microscope 102 at block 212, as described above.

The objective lens database 110 may be populated with transformationvalues when the microscope 102 is fitted with objective lenses, forexample, during manufacture thereof. Alternately, the objective lensdatabase 110 may be populated with transformation values during aconfiguration process facilitated by the microscope controller 104.

Referring to FIG. 3, a flowchart 300 illustrates how the HCIS 100 may beused to develop the transformation values stored in the objective lensdatabase 110. At block 302, one of the objective lenses of themicroscope 102 is selected as a reference objective lens. The selectedlens may be, for example, an objective lens that has the lowestmagnification compared to the other lenses of the microscope 102.

At block 304, the HCIS 100 develops, with assistance from the user, thevalues of the acquisition parameters for use with reference objectivelens. As described above, the evaluation image may be captured andpresented to the user, the user may be allowed to adjust parameters, anda further evaluation image may be captured and presented to the user.The HCIS 100 may iterate in this manner until the user is satisfied withthe evaluation image captured by the HCIS 100, and such evaluation imageis considered a reference image as described below. The transformationvalues associated with the reference objective that have percent unitsare set to one hundred percent. Those transformation values associatedwith the reference that have units associated with a distance are set tozero.

At block 306, the user may select a target objective lens from thoseinstalled in the microscope 102 for which to develop transformationvalues. In some embodiments, the objective lens database 110 may beconfigured with manufacturer provided information for each objectivelens installed in the microscope. Such manufacturer provided informationmay includes an identifier (e.g., a model number) of the objective lens,a numerical aperture of the objective lens, the magnification of theobjective lens, and the X and Y pixel sizes associated with theobjective lens. The X and Y pixel sizes are measures of the pixel sizeat the focal plane of the image capture device of the microscope 102. Ifsuch manufacturer provided information is not already stored in theobjective lens database 110 for the target objective lens, then at block308, the GUI controller 106 may request such information from the user.The configuration module 108 records such information in an entryassociated with the target objective lens in the objective lens database110.

At block 310, for each wavelength, the microscope controller 104 directsthe microscope to capture images using the target objective lens atvarious the exposure times. The GUI controller 106 displays the capturedimages to the user, and requests from the user a selection of the imagethat has an image intensity closest to that of the reference image. Insome embodiments, the configuration module 108 may automaticallyevaluate intensities of the captured images, and selects the image thathas an intensity nearest to that of the reference image. For eachwavelength, the configuration module 108 calculates the percentdifference between the exposure time associated with the selected imageand the exposure time used to capture the reference image, and storessuch percent difference as the transformation value associated with theexposure time parameter and the wavelength.

At block 312, for each wavelength, the microscope controller 104 directsthe microscope to capture images with various distances between thetarget objective lens and a focal plane where the laser is focused. Suchimages are displayed to the user, and the user is asked, using the GUIcontroller 106, to select an image that is at an optimal focal plane.That is, the user is asked to select the image that is most in focus. Insome embodiments, the configuration module 108 may automaticallyevaluate the focus of such captured images and selects the image thathas the best focus or a focus closest to that of the reference image.For each wavelength, the configuration module 108 calculates thedifference in distance from the focal plane associated with the selectedimage and the distance from the focal plane used to capture thereference image, and stores such offset difference as the transformationvalue associated with the focal plane offset parameter and thewavelength.

At block 314, the microscope controller 104 directs the microscope tocapture images with various laser autofocus exposure times until thereis an adequate reflection from the reference sample or a surface of aplate holding the reference sample of a spot of light generated by the alaser for the laser autofocus system to determine the focal plane ofsuch reference sample or surface. The configuration module 108determines a percent difference between the laser autofocus exposuretime that provides an adequate reflection using the target objectivelens and the laser autofocus exposure time used to generate thereference image, and records such percent difference as thetransformation value associated with the laser autofocus exposure timeparameter associated with the target objective lens.

The steps undertaken at blocks 306 through 314 may be repeated for eachobjective lens available for use with the microscope 102 to developtransformation values associated with such objective lens. Thesetransformation values may be developed once and stored in the objectivelens database 110 for subsequent use. Such transformation values neednot be re-developed unless the operating characteristics of themicroscope 102 are changed. Such operating characteristics may includethe introduction of a new component or a modification of a component ofthe HCIS 100 including an objective lens, light source, image capturedevice, and the like. Such operating characteristics may also include amodification that changes the light path between the reference sampleand the image capture device.

It should be apparent to one who has skill in the art, that the samesample, e.g., a reference sample, should be loaded into the microscope102 to develop the transformation values associated with each objectivelens. Such reference sample may be selected by the user or may beprovided by the manufacturer of the HCIS 100. The reference sample maybe selected in accordance with test samples with which the HCIS 100 isto be used. The reference sample may have a consistent imaging responsefrom image acquisition to another. Further, the reference sample mayincorporate materials (for example, fluorescent dyes) representative ofthe materials that are expected to be present in the test samples withwhich the HCIS 100 is to be used.

It should be apparent to those who have skill in the art that anycombination of hardware and/or software may be used to implement theHCIS 100 described herein. It will be understood and appreciated thatone or more of the processes, sub-processes, and process steps describedin connection with FIGS. 1-3 may be performed by hardware, software, ora combination of hardware and software on one or more electronic ordigitally-controlled devices. The software may reside in a softwarememory (not shown) in a suitable electronic processing component orsystem such as, for example, one or more of the functional systems,controllers, devices, components, modules, or sub-modules schematicallydepicted in FIGS. 1-3. The software memory may include an orderedlisting of executable instructions for implementing logical functions(that is, “logic” that may be implemented in digital form such asdigital circuitry or source code, or in analog form such as analogsource such as an analog electrical, sound, or video signal). Theinstructions may be executed within a processing module or controller(e.g., the microscope controller 104, the GUI controller 106, and theconfiguration module 108 of FIG. 1), which includes, for example, one ormore microprocessors, general purpose processors, combinations ofprocessors, digital signal processors (DSPs), field programmable gatearrays (FPGAs), or application-specific integrated circuits (ASICs).Further, the schematic diagrams describe a logical division of functionshaving physical (hardware and/or software) implementations that are notlimited by architecture or the physical layout of the functions. Theexample systems described in this application may be implemented in avariety of configurations and operate as hardware/software components ina single hardware/software unit, or in separate hardware/software units.

The executable instructions may be implemented as a computer programproduct having instructions stored therein which, when executed by aprocessing module of an electronic system, direct the electronic systemto carry out the instructions. The computer program product may beselectively embodied in any non-transitory computer-readable storagemedium for use by or in connection with an instruction execution system,apparatus, or device, such as a electronic computer-based system,processor-containing system, or other system that may selectively fetchthe instructions from the instruction execution system, apparatus, ordevice and execute the instructions. In the context of this document,computer-readable storage medium is any non-transitory means that maystore the program for use by or in connection with the instructionexecution system, apparatus, or device. The non-transitorycomputer-readable storage medium may selectively be, for example, anelectronic, magnetic, optical, electromagnetic, infrared, orsemiconductor system, apparatus, or device. A non-exhaustive list ofmore specific examples of non-transitory computer readable mediainclude: an electrical connection having one or more wires (electronic);a portable computer diskette (magnetic); a random access, i.e.,volatile, memory (electronic); a read-only memory (electronic); anerasable programmable read only memory such as, for example, Flashmemory (electronic); a compact disc memory such as, for example, CD-ROM,CD-R, CD-RW (optical); and digital versatile disc memory, i.e., DVD(optical).

It will also be understood that receiving and transmitting of signals asused in this document means that two or more systems, devices,components, modules, or sub-modules are capable of communicating witheach other via signals that travel over some type of signal path. Thesignals may be communication, power, data, or energy signals, which maycommunicate information, power, or energy from a first system, device,component, module, or sub-module to a second system, device, component,module, or sub-module along a signal path between the first and secondsystem, device, component, module, or sub-module. The signal paths mayinclude physical, electrical, magnetic, electromagnetic,electrochemical, optical, wired, or wireless connections. The signalpaths may also include additional systems, devices, components, modules,or sub-modules between the first and second system, device, component,module, or sub-module.

INDUSTRIAL APPLICABILITY

All references, including publications, patent applications, andpatents, cited herein are hereby incorporated by reference to the sameextent as if each reference were individually and specifically indicatedto be incorporated by reference and were set forth in its entiretyherein.

The use of the terms “a” and “an” and “the” and similar references inthe context of describing the invention (especially in the context ofthe following claims) are to be construed to cover both the singular andthe plural, unless otherwise indicated herein or clearly contradicted bycontext. Recitation of ranges of values herein are merely intended toserve as a shorthand method of referring individually to each separatevalue falling within the range, unless otherwise indicated herein, andeach separate value is incorporated into the specification as if it wereindividually recited herein. All methods described herein can beperformed in any suitable order unless otherwise indicated herein orotherwise clearly contradicted by context. The use of any and allexamples, or exemplary language (e.g., “such as”) provided herein, isintended merely to better illuminate the disclosure and does not pose alimitation on the scope of the disclosure unless otherwise claimed. Nolanguage in the specification should be construed as indicating anynon-claimed element as essential to the practice of the disclosure.

Numerous modifications to the present disclosure will be apparent tothose skilled in the art in view of the foregoing description. It shouldbe understood that the illustrated embodiments are exemplary only, andshould not be taken as limiting the scope of the disclosure.

What is claimed is:
 1. A high content imaging system, comprising: amicroscope having a first objective lens and a second objective lens; anobjective lens database having first and second transformation valuesassociated with the first and the second objective lenses, respectively;a microscope controller that operates the microscope with the firstobjective lens to develop first values of acquisition parameters; and aprocessor that automatically determines second values of the acquisitionparameters using only the first values of the acquisition parameters,first transformation values associated with the first objective lens,and second transformation values associated with the second objectivelens, wherein the first transformation values and the secondtransformation values comprise parametric values stored in the objectivelens database which transform the first values of the acquisitionparameters for the first objective lens into the second values of theacquisition parameters for the second objective lens, wherein themicroscope controller operates the microscope using the second objectivelens and the automatically determined second values of the acquisitionparameters obtained using only a) the first values of the acquisitionparameters for the first objective lens and b) the parametric valuesstored in the objective lens database of both the first transformationvalues associated with the first objective lens and the secondtransformation values associated with the second objective lens.
 2. Thehigh content imaging system of claim 1, further including an imagecapture device.
 3. The high content imaging system of claim 2, whereinthe microscope controller directs the microscope to load the secondobjective lens in the light path between a sample and the image capturedevice.
 4. The high content imaging system of claim 2, wherein themicroscope controller receives from the image capture device a firstimage of a sample captured using the first objective lens and a secondimage of the sample captured using the second objective lens.
 5. Thehigh content imaging system of claim 1, wherein a value of the secondvalues of the acquisition parameters automatically determined by theprocessor is one of an exposure time, focal plane offset, laserautofocus exposure time, and pixel size to use with the secondobjective.
 6. The high content imaging system of claim 1, wherein thevalue of the second values of the acquisition parameters is associatedwith a particular wavelength of light or a channel of the lightspectrum.
 7. The high content imaging system of claim 1, wherein thefirst transformation values include values associated with fluorescentmicroscopy.
 8. The high content imaging system of claim 1, wherein thefirst transformation values include additional values associated withbrightfield microscopy.
 9. The high content imaging system of claim 1,wherein the first transformation values and the second transformationvalues are stored in the optical database prior to the processorautomatically determining the second values of the acquisitionparameters.
 10. A method of operating a high content imaging system,wherein the high content imaging system includes a microscope, a firstobjective lens, a second objective lens, and an image capture device,comprising the steps of: operating the microscope with the firstobjective lens to develop first values of acquisition parameters;automatically determining second values of the acquisition parametersusing only the first values of the acquisition parameters, firsttransformation values associated with the first objective lens, andsecond transformation values associated with the second objective lens,wherein the first transformation values and the second transformationvalues comprise parametric values stored in the objective lens databasewhich transform the first values of the acquisition parameters for thefirst objective lens into the second values of the acquisitionparameters for the second objective lens; and operating the microscopeusing the second objective lens and the automatically determined secondvalues of the acquisition parameters obtained using only a) the firstvalues of the acquisition parameters for the first objective lens and b)the parametric values stored in the objective lens database of both thefirst transformation values associated with the first objective lens andthe second transformation values associated with the second objectivelens.
 11. The method of claim 10, wherein the method further includesoperating an image capture device.
 12. The method of claim 11, whereinthe method further includes directing the microscope to load the secondobjective lens in a light path between a sample and the image capturedevice.
 13. The method of claim 11, wherein the method further includesreceiving a first image of a sample captured using the first objectivelens and a second image of the sample captured using the secondobjective lens.
 14. The method of claim 10, wherein a value of thesecond values of the acquisition parameters is one of an exposure time,focal plane offset, laser autofocus exposure time, and pixel size to usewith the second objective.
 15. The method of claim 10, wherein the valueof the second values of the acquisition parameter is associated with aparticular wavelength of light or a channel of the light spectrum. 16.The method of claim 10, wherein the first transformation values includevalues associated with fluorescent microscopy.
 17. The method of claim16, wherein the first transformation values include additional valuesassociated with brightfield microscopy.
 18. The method of claim 10,wherein the first transformation values and the second transformationvalues are stored in the optical database prior to automaticallydetermining the second values of the acquisition parameters.